Paper Title:
Tomographic Atom Probe: A New Tool for Nanoscale Characterisation
  Abstract

  Info
Periodical
Solid State Phenomena (Volumes 47-48)
Edited by
H. Richter, M. Kittler and C. Claeys
Pages
573-582
DOI
10.4028/www.scientific.net/SSP.47-48.573
Citation
M. Leisch, "Tomographic Atom Probe: A New Tool for Nanoscale Characterisation", Solid State Phenomena, Vols. 47-48, pp. 573-582, 1996
Online since
July 1995
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Price
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