Convergent Beam Electron Diffraction Study of Semiconductor Superlattices and High TC Superconducting Oxides |
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| Journal | Solid State Phenomena (Volume 5) |
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| Volume | Electron Microscopy Applications to Materials Science |
| Edited by | K.H. Kuo |
| Pages | 85-102 |
| DOI | 10.4028/www.scientific.net/SSP.5.85 |
| Citation | K.K. Fung, 1989, Solid State Phenomena, 5, 85 |
| Authors | K.K. Fung |
| Full Paper | 
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