Paper Title:
Chemical Composition and Characterization of the Si/C Interface in Poly-Si Thin Films on Graphite Substrates
  Abstract

  Info
Periodical
Solid State Phenomena (Volumes 51-52)
Edited by
S. Pizzini, H.P. Strunk and J.H. Werner
Pages
295-300
DOI
10.4028/www.scientific.net/SSP.51-52.295
Citation
T. Reindl, T. Fuska, C. Walz, H. Cerva, R. Lemme, C. Weitzel, W. Kruehler, M. Pauli, J. Mueller, "Chemical Composition and Characterization of the Si/C Interface in Poly-Si Thin Films on Graphite Substrates", Solid State Phenomena, Vols. 51-52, pp. 295-300, 1996
Online since
May 1996
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Price
$32.00
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