Paper Title:
Investigation of the Low-Frequency Electrical Noise in Grain Boundaries and Polycrystalline Silicon Films
  Abstract

  Info
Periodical
Solid State Phenomena (Volumes 51-52)
Edited by
S. Pizzini, H.P. Strunk and J.H. Werner
Pages
397-402
DOI
10.4028/www.scientific.net/SSP.51-52.397
Citation
N.N. Tkachenko, G.P. Kolomoets, N.I. Stroiteleva, "Investigation of the Low-Frequency Electrical Noise in Grain Boundaries and Polycrystalline Silicon Films", Solid State Phenomena, Vols. 51-52, pp. 397-402, 1996
Online since
May 1996
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Price
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