Paper Title:
Electron-Beam Induced Current Profiles for Thin Film Heterojunction Analysis
  Abstract

  Info
Periodical
Solid State Phenomena (Volumes 51-52)
Edited by
S. Pizzini, H.P. Strunk and J.H. Werner
Pages
527-532
DOI
10.4028/www.scientific.net/SSP.51-52.527
Citation
R. Scheer, "Electron-Beam Induced Current Profiles for Thin Film Heterojunction Analysis", Solid State Phenomena, Vols. 51-52, pp. 527-532, 1996
Online since
May 1996
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Price
$32.00
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