Relations between Texture and Electrical Parameters of Thin Polycrystalline Zinc Oxide Films |
| Journal |
Solid State Phenomena (Volumes 51 - 52) |
| Volume |
Polycrystalline Semiconductors IV |
| Edited by |
S. Pizzini, H.P. Strunk and J.H. Werner |
| Pages |
541-546 |
| DOI |
10.4028/www.scientific.net/SSP.51-52.541 |
| Citation |
K. Ellmer et al., 1996, Solid State Phenomena, 51-52, 541 |
| Authors |
K. Ellmer, K. Diesner, R. Wendt, S. Fiechter |
| Keywords |
Electrical Conductivity, Texture, Transparent Conductive Oxide Films, X-Ray Diffraction (XRD) |
| Full Paper |
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