Paper Title:
Analysis of Hot-Carrier Effects, 'Kink' Effect and Low Frequency Noise in Polycrystalline Silicon Thin-Film Transistors
  Abstract

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Periodical
Solid State Phenomena (Volumes 51-52)
Edited by
S. Pizzini, H.P. Strunk and J.H. Werner
Pages
585-596
DOI
10.4028/www.scientific.net/SSP.51-52.585
Citation
G. Fortunato, "Analysis of Hot-Carrier Effects, 'Kink' Effect and Low Frequency Noise in Polycrystalline Silicon Thin-Film Transistors", Solid State Phenomena, Vols. 51-52, pp. 585-596, 1996
Online since
May 1996
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Price
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