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Raman Spectroscopic Investigation of ZnO and Doped ZnO Films, Nanoparticles and Bulk Material at Ambient and High Pressures

Journal Solid State Phenomena (Volume 55)
Volume Semiconductor Materials and Technology
Edited by R.M. Mehra and P.C. Mathur
Pages 32-37
DOI 10.4028/www.scientific.net/SSP.55.32
Citation S.K. Sharma et al., 1997, Solid State Phenomena, 55, 32
Authors S.K. Sharma, G.J. Exarhos
Keywords Pressure, Raman Spectroscopy, Stress, Temperature, Thin Film, Zinc Oxide ZnO
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