Band Gap Measurement of the Sintered Cdx Se1-x Films from Reflectance Measurement |
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| Journal | Solid State Phenomena (Volume 55) |
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| Volume | Semiconductor Materials and Technology |
| Edited by | R.M. Mehra and P.C. Mathur |
| Pages | 40-42 |
| DOI | 10.4028/www.scientific.net/SSP.55.40 |
| Citation | S.K. Sharma et al., 1997, Solid State Phenomena, 55, 40 |
| Authors | S.K. Sharma, Vijay Kumar, S.K. Kaushish, T.P. Sharma |
| Keywords | Band Gap, Reflection, Sintering, X-Ray Diffraction Pattern |
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