Temperature-Dependent Behaviour of Chalcogenide Thin Film Contacts on Porous Silicon |
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| Journal | Solid State Phenomena (Volume 55) |
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| Volume | Semiconductor Materials and Technology |
| Edited by | R.M. Mehra and P.C. Mathur |
| Pages | 77-79 |
| DOI | 10.4028/www.scientific.net/SSP.55.77 |
| Citation | S. Chakrabarti et al., 1997, Solid State Phenomena, 55, 77 |
| Authors | S. Chakrabarti, S. Dhar |
| Keywords | Current-Voltage Characteristic, Porous Silicon (PS), Schottky Barrier |
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