Paper Title:
Lattice Defects in Si1-xGex Devices by Proton Irradiation and their Effect on Device Performance
  Abstract

  Info
Periodical
Solid State Phenomena (Volumes 57-58)
Edited by
C. Claeys, J. Vanhellemont, H. Richter and M. Kittler
Pages
239-244
DOI
10.4028/www.scientific.net/SSP.57-58.239
Citation
H. Ohyama, E. Simoen, C. Claeys, J. Vanhellemont, Y. Takami, H. Sunaga, J. Poortmans, M. Caymax, "Lattice Defects in Si1-xGex Devices by Proton Irradiation and their Effect on Device Performance", Solid State Phenomena, Vols. 57-58, pp. 239-244, 1997
Online since
July 1997
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Price
$32.00
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