Paper Title:
Critical Resolved Shear Stress for a Dislocation Loop Growth, Stability and Retrogrowth in Silicon: Application to the 16 MEG DRAM
  Abstract

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Periodical
Solid State Phenomena (Volumes 57-58)
Edited by
C. Claeys, J. Vanhellemont, H. Richter and M. Kittler
Pages
275-286
DOI
10.4028/www.scientific.net/SSP.57-58.275
Citation
B. Leroy, "Critical Resolved Shear Stress for a Dislocation Loop Growth, Stability and Retrogrowth in Silicon: Application to the 16 MEG DRAM", Solid State Phenomena, Vols. 57-58, pp. 275-286, 1997
Online since
July 1997
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Price
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