Paper Title:
Yield Analysis of CMOS Ics
| Periodical | Solid State Phenomena (Volumes 57 - 58) |
|---|---|
| Main Theme | Gettering and Defect Engineering in Semiconductor Technology VII |
| Edited by | C. Claeys, J. Vanhellemont, H. Richter and M. Kittler |
| Pages | 327-336 |
| DOI | 10.4028/www.scientific.net/SSP.57-58.327 |
| Citation | D. Schmitt-Landsiedel, 1997, Solid State Phenomena, 57-58, 327 |
| Authors | D. Schmitt-Landsiedel |
| Keywords | Critical Area, Defect Density, Failure Analysis, Low Voltage CMOS, Manufacturability, Matching, Parameter Variation, Yield |
| Price | US$ 28,- |
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