Paper Title:
Effect of Stress Induced Defects on Electrical Properties of Czochralski Grown Silicon
  Abstract

  Info
Periodical
Solid State Phenomena (Volumes 57-58)
Edited by
C. Claeys, J. Vanhellemont, H. Richter and M. Kittler
Pages
393-400
DOI
10.4028/www.scientific.net/SSP.57-58.393
Citation
A. Misiuk, W. Jung, B. Surma, J. Jun, M. Rozental, "Effect of Stress Induced Defects on Electrical Properties of Czochralski Grown Silicon", Solid State Phenomena, Vols. 57-58, pp. 393-400, 1997
Online since
July 1997
Export
Price
$32.00
Share

In order to see related information, you need to Login.

In order to see related information, you need to Login.