Paper Title:
Improved Extraction of Si Substrate Parameters from Combined I-V and C-V Measurements on P-N Junction Diodes
  Abstract

  Info
Periodical
Solid State Phenomena (Volumes 57-58)
Edited by
C. Claeys, J. Vanhellemont, H. Richter and M. Kittler
Pages
477-482
DOI
10.4028/www.scientific.net/SSP.57-58.477
Citation
A. Czerwinski, E. Simoen, J. Vanhellemont, D. Tomaszewski, J. Gibki, A. Bakowski, "Improved Extraction of Si Substrate Parameters from Combined I-V and C-V Measurements on P-N Junction Diodes", Solid State Phenomena, Vols. 57-58, pp. 477-482, 1997
Online since
July 1997
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Price
$32.00
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