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Use of Gettering and Defect Induced Processes in Ultra-Thin Buried Oxide Synthesis

Journal Solid State Phenomena (Volumes 57 - 58)
Volume Gettering and Defect Engineering in Semiconductor Technology VII
Edited by C. Claeys, J. Vanhellemont, H. Richter and M. Kittler
Pages 97-102
DOI 10.4028/www.scientific.net/SSP.57-58.97
Citation V.G. Litovchenko et al., 1997, Solid State Phenomena, 57-58, 97
Authors V.G. Litovchenko, A.A. Efremov, B.N. Romanyuk, V.P. Melnik, C. Claeys
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