Paper Title:
Photo-Thermal Ionization Spectroscopy of Point Defects in Semiconductors
  Abstract

  Info
Periodical
Solid State Phenomena (Volumes 6-7)
Edited by
M. Kittler
Pages
277-288
DOI
10.4028/www.scientific.net/SSP.6-7.277
Citation
H. G. Grimmeiss, M. Kleverman, "Photo-Thermal Ionization Spectroscopy of Point Defects in Semiconductors", Solid State Phenomena, Vols. 6-7, pp. 277-288, 1989
Online since
January 1989
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Price
$32.00
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