Paper Title:
The Capacitance Microscope: A Non-Contacting Stylus Technique for the Investigation of Semicionductor Surfaces
  Abstract

  Info
Periodical
Solid State Phenomena (Volumes 6-7)
Edited by
M. Kittler
Pages
411-422
DOI
10.4028/www.scientific.net/SSP.6-7.411
Citation
H.P. Kleinknecht, H. Meier, "The Capacitance Microscope: A Non-Contacting Stylus Technique for the Investigation of Semicionductor Surfaces", Solid State Phenomena, Vols. 6-7, pp. 411-422, 1989
Online since
January 1989
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Price
$32.00
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