Paper Title:
Silicon Plates Homogeneity Diagnostics Method by Means of Semiconductor-Electrolyte Structure Surface Photovoltage Measurement
  Abstract

  Info
Periodical
Solid State Phenomena (Volumes 6-7)
Edited by
M. Kittler
Pages
457-460
DOI
10.4028/www.scientific.net/SSP.6-7.457
Citation
A.O. Arackelyan, A.K. Arevyan, V.M. Arutyunyan, M.S. Kazaryan, V.A. Melicsetyan, V.L. Elbackyan, "Silicon Plates Homogeneity Diagnostics Method by Means of Semiconductor-Electrolyte Structure Surface Photovoltage Measurement", Solid State Phenomena, Vols. 6-7, pp. 457-460, 1989
Online since
January 1989
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Price
$32.00
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