Implantation Induced Defect Modification in P Doped Bipolar Structures |
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| Journal | Solid State Phenomena (Volumes 6 - 7) |
|---|---|
| Volume | Gettering and Defect Engineering in Semiconductor Technology |
| Edited by | M. Kittler |
| Pages | 73-78 |
| DOI | 10.4028/www.scientific.net/SSP.6-7.73 |
| Citation | D. Krueger et al., 1989, Solid State Phenomena, 6-7, 73 |
| Authors | D. Krueger, J. Dziesiaty |
| Full Paper |
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