Solid State Phenomena

Paper Title	Page
Charge Collection Scanning Microscopy: Non-Conventional Applications Authors: Antonio Castaldini, Anna Cavallini	1
EBIC Study of Field Effect Transistors on Modulation-Doped AlGaAs/lnGaAs/GaAs Heterostructures Authors: B. Sieber, J.-L. Farvacque	13
EBIC of Strained Si/SiGe 2DEGs Showing Lateral Electron Confinement Authors: Carl E. Norman, N. Griffin, D.D. Arnone, D.J. Paul, M. Pepper, B. Gallas, J.M. Fernández	25
Laser Induced Mapping for Separation of Bulk and Surface Recombination Authors: H.-C. Ostendorf, A.L. Endrös	33
Analysis of Minority Carrier Diffusion in the Presence of a Dislocation Array: Effective Diffusion Length, Luminescence Efficiency and Dark Current Authors: C. Donolato	45
Detection and Characterisation of 'Sleeping' Defects in Silicon by LBIC Scan Maps at 80 K. Authors: Santo Martinuzzi, Isabelle Périchaud, Scott A. McHugo	53
Combined MOS/EBIC and Tem Study of Electrically Active Defects in SOI Wafers Authors: O.V. Kononchuk, I.E. Bondarenko, George A. Rozgonyi	61
Characterization of Laser Structures by EBIC Measurements and Simulation Authors: I. Rechenberg, H. Wenzel, A. Knauer, G. Beister	69
Evaluation of p-n Junction Position and Channel Length in Si Devices with Resolution of a Few Nanometers by Low-Energy EBIC Authors: Martin Kittler, J. Lärz	77
Monte Carlo Simulation of the Recombination Contrast of Dislocations Authors: N. Tabet	89

Paper Title

Page

Charge Collection Scanning Microscopy: Non-Conventional Applications

Authors: Antonio Castaldini, Anna Cavallini

EBIC Study of Field Effect Transistors on Modulation-Doped AlGaAs/lnGaAs/GaAs Heterostructures

Authors: B. Sieber, J.-L. Farvacque

EBIC of Strained Si/SiGe 2DEGs Showing Lateral Electron Confinement

Authors: Carl E. Norman, N. Griffin, D.D. Arnone, D.J. Paul, M. Pepper, B. Gallas, J.M. Fernández

Laser Induced Mapping for Separation of Bulk and Surface Recombination

Authors: H.-C. Ostendorf, A.L. Endrös

Analysis of Minority Carrier Diffusion in the Presence of a Dislocation Array: Effective Diffusion Length, Luminescence Efficiency and Dark Current

Authors: C. Donolato

Detection and Characterisation of 'Sleeping' Defects in Silicon by LBIC Scan Maps at 80 K.

Authors: Santo Martinuzzi, Isabelle Périchaud, Scott A. McHugo

Combined MOS/EBIC and Tem Study of Electrically Active Defects in SOI Wafers

Authors: O.V. Kononchuk, I.E. Bondarenko, George A. Rozgonyi

Characterization of Laser Structures by EBIC Measurements and Simulation

Authors: I. Rechenberg, H. Wenzel, A. Knauer, G. Beister

Evaluation of p-n Junction Position and Channel Length in Si Devices with Resolution of a Few Nanometers by Low-Energy EBIC

Authors: Martin Kittler, J. Lärz

Monte Carlo Simulation of the Recombination Contrast of Dislocations

Authors: N. Tabet

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Beam Injection Assessment of Defects in Semiconductors