Main Theme:
Beam Injection Assessment of Defects in Semiconductors
Volumes 63 - 64
doi:
10.4028/www.scientific.net/SSP.63-64
Paper Titles published in this Main Theme:
| Paper Title |
Page |
|
Charge Collection Scanning Microscopy: Non-Conventional Applications
Authors: Antonio Castaldini, Anna Cavallini
|
1
|
|
EBIC Study of Field Effect Transistors on Modulation-Doped AlGaAs/lnGaAs/GaAs Heterostructures
Authors: B. Sieber, J.-L. Farvacque
|
13
|
|
EBIC of Strained Si/SiGe 2DEGs Showing Lateral Electron Confinement
Authors: Carl E. Norman, N. Griffin, D.D. Arnone, D.J. Paul, M. Pepper, B. Gallas, J.M. Fernández
|
25
|
|
Laser Induced Mapping for Separation of Bulk and Surface Recombination
Authors: H.-C. Ostendorf, A.L. Endrös
|
33
|
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Analysis of Minority Carrier Diffusion in the Presence of a Dislocation Array: Effective Diffusion Length, Luminescence Efficiency and Dark Current
Authors: C. Donolato
|
45
|
|
Detection and Characterisation of 'Sleeping' Defects in Silicon by LBIC Scan Maps at 80 K.
Authors: Santo Martinuzzi, Isabelle Périchaud, Scott A. McHugo
|
53
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Combined MOS/EBIC and Tem Study of Electrically Active Defects in SOI Wafers
Authors: O.V. Kononchuk, I.E. Bondarenko, George A. Rozgonyi
|
61
|
|
Characterization of Laser Structures by EBIC Measurements and Simulation
Authors: I. Rechenberg, H. Wenzel, A. Knauer, G. Beister
|
69
|
|
Evaluation of p-n Junction Position and Channel Length in Si Devices with Resolution of a Few Nanometers by Low-Energy EBIC
Authors: Martin Kittler, J. Lärz
|
77
|
|
Monte Carlo Simulation of the Recombination Contrast of Dislocations
Authors: N. Tabet
|
89
|
Showing 1 to 10 of 63 Paper Titles