Determination of the Surface Recombination Velocity and of Its Evolution in Monocrystalline Silicon by the Light Beam Induced Current Technique in Planar Configuration |
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| Journal | Solid State Phenomena (Volumes 63 - 64) |
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| Volume | Beam Injection Assessment of Defects in Semiconductors |
| Edited by | M. Kittler, O. Breitenstein, A. Endrös, W. Schröter |
| Pages | 123-130 |
| DOI | 10.4028/www.scientific.net/SSP.63-64.123 |
| Authors | S. Spadoni, Maurizio Acciarri, G. Barbi, Sergio Pizzini |
| Keywords | LBIC, Silicon, Surface Recombination |
| Full Paper | 
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