Determination of the Surface Recombination Velocity and of Its Evolution in Monocrystalline Silicon by the Light Beam Induced Current Technique in Planar Configuration |
| Journal |
Solid State Phenomena (Volumes 63 - 64) |
| Volume |
Beam Injection Assessment of Defects in Semiconductors |
| Edited by |
M. Kittler, O. Breitenstein, A. Endrös, W. Schröter |
| Pages |
123-130 |
| DOI |
10.4028/www.scientific.net/SSP.63-64.123 |
| Citation |
S. Spadoni et al., 1998, Solid State Phenomena, 63-64, 123 |
| Authors |
S. Spadoni, Maurizio Acciarri, G. Barbi, Sergio Pizzini |
| Keywords |
LBIC, Silicon, Surface Recombination |
| Full Paper |
Get the full paper by clicking here
|
