EBIC Study of Field Effect Transistors on Modulation-Doped AlGaAs/lnGaAs/GaAs Heterostructures |
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| Journal | Solid State Phenomena (Volumes 63 - 64) |
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| Volume | Beam Injection Assessment of Defects in Semiconductors |
| Edited by | M. Kittler, O. Breitenstein, A. Endrös, W. Schröter |
| Pages | 13-24 |
| DOI | 10.4028/www.scientific.net/SSP.63-64.13 |
| Citation | B. Sieber et al., 1998, Solid State Phenomena, 63-64, 13 |
| Authors | B. Sieber, J.-L. Farvacque |
| Full Paper | 
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