Paper Title:
Minority Carrier Diffusion Length in AlGaN: A Combined Electron Beam Induced Current and Transmission Microscopy Study
  Abstract

  Info
Periodical
Solid State Phenomena (Volumes 63-64)
Edited by
M. Kittler, O. Breitenstein, A. Endrös, W. Schröter
Pages
139-146
DOI
10.4028/www.scientific.net/SSP.63-64.139
Citation
A. Cremades, M. Albrecht, A. Voigt, J. Krinke, R. Dimitrov, O. Ambacher, M. Stutzmann, "Minority Carrier Diffusion Length in AlGaN: A Combined Electron Beam Induced Current and Transmission Microscopy Study", Solid State Phenomena, Vols. 63-64, pp. 139-146, 1998
Online since
December 1998
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Price
$32.00
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