Paper Title:
Nanocharacterization of Semiconductors by Scanning Photoluminescence Microscopy
  Abstract

  Info
Periodical
Solid State Phenomena (Volumes 63-64)
Edited by
M. Kittler, O. Breitenstein, A. Endrös, W. Schröter
Pages
151-158
DOI
10.4028/www.scientific.net/SSP.63-64.151
Citation
P. Fischer, J. Christen, M. Zacharias, H. Nakashima, K. Hiramatsu, "Nanocharacterization of Semiconductors by Scanning Photoluminescence Microscopy", Solid State Phenomena, Vols. 63-64, pp. 151-158, 1998
Online since
December 1998
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Price
$32.00
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