Paper Title:
Local Stress, Surface Reconstruction, and Bulk Defect Nucleation: An STM Study on Silicon
  Abstract

  Info
Periodical
Solid State Phenomena (Volumes 63-64)
Edited by
M. Kittler, O. Breitenstein, A. Endrös, W. Schröter
Pages
261-272
DOI
10.4028/www.scientific.net/SSP.63-64.261
Citation
H. J. Müssig, J. Dąbrowski, "Local Stress, Surface Reconstruction, and Bulk Defect Nucleation: An STM Study on Silicon", Solid State Phenomena, Vols. 63-64, pp. 261-272, 1998
Online since
December 1998
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Price
$32.00
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