Paper Title:
The Sloc Positron Beam Technique – A Unique Tool for the Study of Vacancy-Type Defects in Semiconductors
  Abstract

  Info
Periodical
Solid State Phenomena (Volumes 63-64)
Edited by
M. Kittler, O. Breitenstein, A. Endrös, W. Schröter
Pages
291-300
DOI
10.4028/www.scientific.net/SSP.63-64.291
Citation
R. Krause-Rehberg, S. Eichler, J. Gebauer, F. Börner, "The Sloc Positron Beam Technique – A Unique Tool for the Study of Vacancy-Type Defects in Semiconductors", Solid State Phenomena, Vols. 63-64, pp. 291-300, 1998
Online since
December 1998
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Price
$32.00
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