Laser Induced Mapping for Separation of Bulk and Surface Recombination |
| Journal |
Solid State Phenomena (Volumes 63 - 64) |
| Volume |
Beam Injection Assessment of Defects in Semiconductors |
| Edited by |
M. Kittler, O. Breitenstein, A. Endrös, W. Schröter |
| Pages |
33-44 |
| DOI |
10.4028/www.scientific.net/SSP.63-64.33 |
| Citation |
H.-C. Ostendorf et al., 1998, Solid State Phenomena, 63-64, 33 |
| Authors |
H.-C. Ostendorf, A.L. Endrös |
| Keywords |
Bulk Recombination, Crystalline Silicon, Excess Carrier Lifetime, Solar Cell, Surface Recombination |
| Full Paper |
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