Paper Title:
Scanning Photoluminescence for Wafer Characterization
  Abstract

  Info
Periodical
Solid State Phenomena (Volumes 63-64)
Edited by
M. Kittler, O. Breitenstein, A. Endrös, W. Schröter
Pages
421-432
DOI
10.4028/www.scientific.net/SSP.63-64.421
Citation
V. Higgs, F. Chin, X. C. Wang, "Scanning Photoluminescence for Wafer Characterization", Solid State Phenomena, Vols. 63-64, pp. 421-432, 1998
Online since
December 1998
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Price
$32.00
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