The Future of Beam Injection Techniques: Summary of the Round-Table Discussion Held at BIADS 98 |
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| Journal | Solid State Phenomena (Volumes 63 - 64) |
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| Volume | Beam Injection Assessment of Defects in Semiconductors |
| Edited by | M. Kittler, O. Breitenstein, A. Endrös, W. Schröter |
| Pages | 529-0 |
| DOI | 10.4028/www.scientific.net/SSP.63-64.529 |
| Citation | A. Endrös et al., 1998, Solid State Phenomena, 63-64, 529 |
| Authors | A. Endrös, A. Jakubowicz, Zbigniew J. Radzimski |
| Full Paper | 
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