Paper Title:
Detection and Characterisation of 'Sleeping' Defects in Silicon by LBIC Scan Maps at 80 K.
  Abstract

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Periodical
Solid State Phenomena (Volumes 63-64)
Edited by
M. Kittler, O. Breitenstein, A. Endrös, W. Schröter
Pages
53-60
DOI
10.4028/www.scientific.net/SSP.63-64.53
Citation
S. Martinuzzi, I. Périchaud, S. A. McHugo, "Detection and Characterisation of 'Sleeping' Defects in Silicon by LBIC Scan Maps at 80 K.", Solid State Phenomena, Vols. 63-64, pp. 53-60, 1998
Online since
December 1998
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