Characterization of Laser Structures by EBIC Measurements and Simulation |
| Journal |
Solid State Phenomena (Volumes 63 - 64) |
| Volume |
Beam Injection Assessment of Defects in Semiconductors |
| Edited by |
M. Kittler, O. Breitenstein, A. Endrös, W. Schröter |
| Pages |
69-76 |
| DOI |
10.4028/www.scientific.net/SSP.63-64.69 |
| Citation |
I. Rechenberg et al., 1998, Solid State Phenomena, 63-64, 69 |
| Authors |
I. Rechenberg, H. Wenzel, A. Knauer, G. Beister |
| Keywords |
Electron Beam Induced Current (EBIC), Semiconductor Lasers, Simulation of EBIC Profiles |
| Full Paper |
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