Ultra Clean Processing of Silicon Surfaces
Solid State Phenomena Volumes 65 - 66
doi:10.4028/www.scientific.net/SSP.65-66
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p1
The Rinsing Problem: Effect of Solute-Surface Interactions on Wafer Purity
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305 K
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Authors: Lee M. Loewenstein, Paul W. Mertens
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p7
Hydrogenated Ultrapure Water Production System for Future Wet Cleaning Process
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226 K
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Authors: Hiroshi Morita, Jun ichi Ida, T. Mizuniwa, Tadahiro Ohmi
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p11
Behaviour of Metallic Contaminants during Mos Processing
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243 K
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Authors: Twan Bearda, Stefan De Gendt, Lee M. Loewenstein, M. Knotter, Paul W. Mertens, Marc M. Heyns
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p15
Hydrogen Peroxide Decomposition in Ammonia Solutions
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189 K
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Authors: D. Martin Knotter, Stefan De Gendt, M. Baeyens, Paul W. Mertens, Marc M. Heyns
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p19
New Aspects of the Diluted Dynamic Clean Process
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222 K
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Authors: F. Tardif, T. Lardin, A. Maciejny, Adrien Danel, Pieter Boelen, C. Cowache, Ismail Kashkoush, R. Novak
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p23
Single Step Alkaline Cleaning Solution for Advanced Semiconductor Cleaning
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228 K
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Authors: M. Baeyens, W. Hub, Bernd O. Kolbesen, A.R. Martin, Paul W. Mertens
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p27
Particle Removal Efficiency and Silicon Roughness in HF-DIW/O3/Megasonics Cleaning
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276 K
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Authors: Mauro Alessandri, Enrico Bellandi, Francesco Pipia, F. Cazzaniga, K. Wolke, M. Schenkl
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p31
Industrial Trends in Wet Processing Technology
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272 K
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Authors: L.F.Tz. Kwakman, M. Geomini, Didier Lévy, D. Malgouyres
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p35
Particle Addition Behaviour of Oxide Stripping by HF Solutions
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283 K
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Authors: Enrico Bellandi, Mauro Alessandri, Francesco Pipia, A. Tonti
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p39
The Electrochemical Kinetics of Silicon Surface Corrosion in HF Containing Dilute Solutions
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217 K
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Authors: V. Bertagna, F. Rouelle, R. Erre, M. Chemla
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p43
Influence of the Dissolved Gas in Cleaning Solution on Silicon Wafer Cleaning Efficiency
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212 K
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Authors: H. Kanetaka, Toshihiko Kujime, H. Yazaki, T. Kezuka, Tadahiro Ohmi
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p49
Optimization of Deionized Water Consumption in Wafer Wet Processing
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170 K
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Authors: Ismail Kashkoush, R. Novak
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p53
Chemistry of the Silicon Oxide Surface: Adsorption from SC1 Solutions
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266 K
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Authors: L. Hall, J. Sees, Trace Hurd, B. Schmidt, L. Bellay, Lee M. Loewenstein, Paul W. Mertens
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p59
Production of High Concentrations of Bubble-Free Dissolved Ozone in Water
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150 K
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Authors: C. Gottschalk, U. Beuscher, S. Hardwick, Masakazu Kobayashi, J. Schweckendiek, M. Wikol
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p63
Si-Purifier: A Point of Use Purifier for Noble Metals in HF Baths
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214 K
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Authors: Alessio Beverina, F. Tardif