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Post CMP Cleaning Using a Novel HF Compatible High Power Magasonic Tank

Journal Solid State Phenomena (Volumes 65 - 66)
Volume Ultra Clean Processing of Silicon Surfaces IV
Edited by Marc Heyns, Marc Meuris and Paul Mertens
Pages 169-172
DOI 10.4028/www.scientific.net/SSP.65-66.169
Citation F. Tardif et al., 1998, Solid State Phenomena, 65-66, 169
Authors F. Tardif, T. Lardin, I. Constant, M. Fayolle, Pieter Boelen, C. Cowache, Ismail Kashkoush, R. Novak
Keywords Backend, Cleaning, CMP, HF, Megasonics
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