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Metal Enhanced Oxidation of Silicon

Journal Solid State Phenomena (Volumes 65 - 66)
Volume Ultra Clean Processing of Silicon Surfaces IV
Edited by Marc Heyns, Marc Meuris and Paul Mertens
Pages 245-248
DOI 10.4028/www.scientific.net/SSP.65-66.245
Citation M. Börner et al., 1998, Solid State Phenomena, 65-66, 245
Authors M. Börner, N. Junghans, S. Landau, Bernd O. Kolbesen
Keywords Al Contamination, Cu Contamination, Enhanced Oxide Growth, SC-1 Solution
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