Paper Title:
Thickness Control of the Amorphous Buffer Layer of Hydrogenated Nanocrystalline Silicon: Effect of the Dopant Concentration
  Abstract

  Info
Periodical
Solid State Phenomena (Volumes 67-68)
Edited by
J.H. Werner, H.P. Strunk, H.W. Schock
Pages
137-142
DOI
10.4028/www.scientific.net/SSP.67-68.137
Citation
F. Gourbilleau, A. Achiq, P. Voivenel, R. Rizk, "Thickness Control of the Amorphous Buffer Layer of Hydrogenated Nanocrystalline Silicon: Effect of the Dopant Concentration", Solid State Phenomena, Vols. 67-68, pp. 137-142, 1999
Online since
April 1999
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Price
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