Paper Title:
Fine-Crystalline Silicon Grown at Low Temperatures: Investigations by High-Resolution Microscopy
  Abstract

  Info
Periodical
Solid State Phenomena (Volumes 67-68)
Edited by
J.H. Werner, H.P. Strunk, H.W. Schock
Pages
211-216
DOI
10.4028/www.scientific.net/SSP.67-68.211
Citation
C. Ross, J. Herion, L. Houben, R. Carius, H. Wagner, "Fine-Crystalline Silicon Grown at Low Temperatures: Investigations by High-Resolution Microscopy", Solid State Phenomena, Vols. 67-68, pp. 211-216, 1999
Online since
April 1999
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