Atomic Structure and Properties of Extended Defects in Silicon |
| Journal |
Solid State Phenomena (Volumes 67 - 68) |
| Volume |
Polycrystalline Semiconductors V |
| Edited by |
J.H. Werner, H.P. Strunk, H.W. Schock |
| Pages |
3-14 |
| DOI |
10.4028/www.scientific.net/SSP.67-68.3 |
| Citation |
M.F. Chisholm et al., 1999, Solid State Phenomena, 67-68, 3 |
| Authors |
M.F. Chisholm, Ryszard Buczko, M. Mostoller, T. Kaplan, A. Maiti, Sokrates T. Pantelides, S.J. Pennycook |
| Keywords |
Dislocations, Electronic Structures, Grain Boundary, TEM, Z-Contrast |
| Full Paper |
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