Paper Title:
Defect Engineering in Polycrystalline Silicon Using Ultrasound
  Abstract

  Info
Periodical
Solid State Phenomena (Volumes 67-68)
Edited by
J.H. Werner, H.P. Strunk, H.W. Schock
Pages
485-496
DOI
10.4028/www.scientific.net/SSP.67-68.485
Citation
S. S. Ostapenko, "Defect Engineering in Polycrystalline Silicon Using Ultrasound", Solid State Phenomena, Vols. 67-68, pp. 485-496, 1999
Online since
April 1999
Export
Price
$32.00
Share

In order to see related information, you need to Login.

In order to see related information, you need to Login.