Paper Title:
Wet-Chemically Passivated Silicon Interfaces: Characterization by Surface Photovoltage Measurements, and Spectroscopic Ellipsometry Methods
  Abstract

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Periodical
Solid State Phenomena (Volumes 67-68)
Edited by
J.H. Werner, H.P. Strunk, H.W. Schock
Pages
515-520
DOI
10.4028/www.scientific.net/SSP.67-68.515
Citation
H. Angermann, W. Henrion, A. Röseler, M. Rebien, "Wet-Chemically Passivated Silicon Interfaces: Characterization by Surface Photovoltage Measurements, and Spectroscopic Ellipsometry Methods", Solid State Phenomena, Vols. 67-68, pp. 515-520, 1999
Online since
April 1999
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Price
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