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Qualitative and Quantitative Analysis of Thin Film Heterostructures by Electron Beam Induced Current

Journal Solid State Phenomena (Volumes 67 - 68)
Volume Polycrystalline Semiconductors V
Edited by J.H. Werner, H.P. Strunk, H.W. Schock
Pages 57-68
DOI 10.4028/www.scientific.net/SSP.67-68.57
Citation R. Scheer, 1999, Solid State Phenomena, 67-68, 57
Authors R. Scheer
Keywords Diffusion Length, Electron Beam Induced Current (EBIC), Grain Boundary, Solar Cell, Thin Film
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