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200 GHz Potential of Si-Based Devices

Journal Solid State Phenomena (Volumes 69 - 70)
Volume Gettering and Defect Engineering in Semiconductor Technology VIII
Edited by H.G. Grimmeiss, L. Ask, M. Kleverman, M. Kittler and H. Richter
Pages 121-130
DOI 10.4028/www.scientific.net/SSP.69-70.121
Citation Uwe König, 1999, Solid State Phenomena, 69-70, 121
Authors Uwe König
Keywords Bipolar Transistor, Field-Effect Transistor, Frequency, Gate Delay, Low Temperature Operation, Noise, Silicon Germanium
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