Equilibrium Critical Thickness of Strained Buried SiGe Layers |
| Journal |
Solid State Phenomena (Volumes 69 - 70) |
| Volume |
Gettering and Defect Engineering in Semiconductor Technology VIII |
| Edited by |
H.G. Grimmeiss, L. Ask, M. Kleverman, M. Kittler and H. Richter |
| Pages |
149-154 |
| DOI |
10.4028/www.scientific.net/SSP.69-70.149 |
| Citation |
A. Fischer et al., 1999, Solid State Phenomena, 69-70, 149 |
| Authors |
A. Fischer, G. Kissinger, Hans Richter, P. Zaumseil |
| Keywords |
Critical Thickness, Equilibrium Theory, SiGe Heteroepitaxy, Strained Layer |
| Full Paper |
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