Paper Title:
Improved Microwave Absorption Technique for Bulk and Surface Lifetime Analysis in Processed Si Wafers
  Abstract

  Info
Periodical
Solid State Phenomena (Volumes 69-70)
Edited by
H.G. Grimmeiss, L. Ask, M. Kleverman, M. Kittler and H. Richter
Pages
155-160
DOI
10.4028/www.scientific.net/SSP.69-70.155
Citation
E. Gaubas, E. Simoen, C. Claeys, A. Poyai, "Improved Microwave Absorption Technique for Bulk and Surface Lifetime Analysis in Processed Si Wafers", Solid State Phenomena, Vols. 69-70, pp. 155-160, 1999
Online since
August 1999
Export
Price
$32.00
Share

In order to see related information, you need to Login.

In order to see related information, you need to Login.