Paper Title:
X-Ray Diffraction Studies of the Influence of Substitutional Carbon on Si/Ge Interdiffusion in SiGe/Si Superlattices
  Abstract

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Periodical
Solid State Phenomena (Volumes 69-70)
Edited by
H.G. Grimmeiss, L. Ask, M. Kleverman, M. Kittler and H. Richter
Pages
203-208
DOI
10.4028/www.scientific.net/SSP.69-70.203
Citation
P. Zaumseil, H. Rücker, "X-Ray Diffraction Studies of the Influence of Substitutional Carbon on Si/Ge Interdiffusion in SiGe/Si Superlattices", Solid State Phenomena, Vols. 69-70, pp. 203-208, 1999
Online since
August 1999
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Price
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