Paper Title:
Comparative Analysis of Light Emitting Properties of Si: Er and Ge/Si1-xGex Epitaxial Structures Obtained by MBE Method
  Abstract

  Info
Periodical
Solid State Phenomena (Volumes 69-70)
Edited by
H.G. Grimmeiss, L. Ask, M. Kleverman, M. Kittler and H. Richter
Pages
377-384
DOI
10.4028/www.scientific.net/SSP.69-70.377
Citation
L.K. Orlov, A.V. Potapov, N.L. Ivina, E.A. Steinman, V.I. Vdovin, "Comparative Analysis of Light Emitting Properties of Si: Er and Ge/Si1-xGex Epitaxial Structures Obtained by MBE Method", Solid State Phenomena, Vols. 69-70, pp. 377-384, 1999
Online since
August 1999
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Price
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