Paper Title:
In-Situ Photoexcitation-Induced Perturbations of Defect Complex Concentration and Distribution in Silicon Implanted with Light and Heavy Ions
  Abstract

  Info
Periodical
Solid State Phenomena (Volumes 69-70)
Edited by
H.G. Grimmeiss, L. Ask, M. Kleverman, M. Kittler and H. Richter
Pages
397-402
DOI
10.4028/www.scientific.net/SSP.69-70.397
Citation
N. Yarykin, C.R. Cho, R.A. Zuhr, G. A. Rozgonyi, "In-Situ Photoexcitation-Induced Perturbations of Defect Complex Concentration and Distribution in Silicon Implanted with Light and Heavy Ions", Solid State Phenomena, Vols. 69-70, pp. 397-402, 1999
Online since
August 1999
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Price
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