Paper Title:
P-N- Junction Peripheral Current Analysis using Gated Diode Measurements
  Abstract

  Info
Periodical
Solid State Phenomena (Volumes 69-70)
Edited by
H.G. Grimmeiss, L. Ask, M. Kleverman, M. Kittler and H. Richter
Pages
437-442
DOI
10.4028/www.scientific.net/SSP.69-70.437
Citation
A. Czerwinski, E. Simoen, A. Poyai, C. Claeys, "P-N- Junction Peripheral Current Analysis using Gated Diode Measurements", Solid State Phenomena, Vols. 69-70, pp. 437-442, 1999
Online since
August 1999
Export
Price
$32.00
Share

In order to see related information, you need to Login.

In order to see related information, you need to Login.