Paper Title:
Reconstruction of Deep Level Defect Distribution from DLTS Measurements in Compensated Semiconductors
  Abstract

  Info
Periodical
Solid State Phenomena (Volumes 69-70)
Edited by
H.G. Grimmeiss, L. Ask, M. Kleverman, M. Kittler and H. Richter
Pages
531-538
DOI
10.4028/www.scientific.net/SSP.69-70.531
Citation
O.A. Soltanovich, E. B. Yakimov, N. Yarykin, "Reconstruction of Deep Level Defect Distribution from DLTS Measurements in Compensated Semiconductors", Solid State Phenomena, Vols. 69-70, pp. 531-538, 1999
Online since
August 1999
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Price
$32.00
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