Gettering and Defect Engineering in Semiconductor Technology VIII

Iron Gettering on Cavities Produced by Helium Implantation

Authors: F. Roqueta, A. Grob, J.J. Grob, Christiane Dubois, J. Fauré, Laurent Ventura

Gettering at Vacancy and Interstitial-Rich Regions in MeV Ion Implanted Silicon

Authors: K.L. Beaman, J.M. Glasko, Sergei V. Koveshnikov, George A. Rozgonyi

Laser-Stimulated Gettering Processes in Cd_xHg_1-xTe Solid Solutions

Authors: V.A. Gnatyuk, O.S. Gorodnychenko, A.V. Lomovtsev, P.O. Mozol', O.I. Vlasenko

Gettering Strength Assessment Based on Lifetime Measurements

Authors: F.G. Kirscht, B. Orschel, V. Higgs, A. Buczkowski

Impurity Gettering Investigation in the Si-SiO₂ System

Authors: Daniel Kropman, V. Poll, L. Tambek, Tiit Kärner, U. Abru, M. Strik

Computer Simulation of Gettering Induced Oxygen Redistribution in SOI Structures

Authors: V.G. Litovchenko, A.A. Efremov, C. Claeys

Surface Gettering Background Impurities and Defects in GaAs Plates

Authors: N. Shmidt, A.T. Gorelenok, Valentin V. Emtsev, Alex A. Kamanin, A.V. Markov, M. Mezdrogina, D.S. Poloskin, L. Vlasenko

Gettering Processes for the Preparation of Silicon Solar Cell Material

Authors: A.A. Efremov, N.I. Klyui, V.G. Litovchenko, V.G. Popov, A.B. Romanyuk, B.N. Romanyuk

Gettering of Unintentionally Contaminated Silicon Wafers by Phosphorous Ion Implantation and Annealing

Authors: Marko Yli-Koski, J. Mellin, V. Ovchinnikov

Oxygen and Carbon Clustering in Cz-Si during Electron Irradiation at Elevated Temperatures

Authors: J. Lennart Lindström, T. Hallberg, J. Hermansson, L.I. Murin, V.P. Markevich, Mats Kleverman, Bengt G. Svensson